X-Ray Optics and Nanoimaging
Our research
Senior scientist: Ulrich Vogt
X-ray nanoimaging is a rapidly evolving frontier at synchrotron radiation and X-ray free-electron laser facilities worldwide. By focusing X-ray radiation to spot sizes as small as 10–100 nanometers, this cutting-edge technology enables groundbreaking research across numerous scientific fields.
The unique capability of X-ray nano imaging lies in its ability to conduct direct in-situ and in-operando experiments, even in extreme physical environments. This technology provides an unparalleled link between a material's structure and its physical properties, offering insights that were previously inaccessible.
We design and manufacture advanced diffractive zone plate optics that achieve diffraction-limited resolution in the 10–100 nm range, tailored for X-ray nano imaging in both the soft and hard X-ray spectrum. In collaboration with Lund University, we have developed the NanoMAX beamline and a zone-plate-based X-ray microscope at the Swedish synchrotron source MAX IV.
Our long-term goal is to enable 3D X-ray imaging experiments with a resolution as fine as 10 nanometers.
Key references
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M. Åstrand, M. Kahnt, U. Johansson, U. Vogt, "Adaptive multi-beam X-ray ptychography," Opt. Express 32, 22771-22780 (2024).
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M. Åstrand, H. Ohlin, T. Frisk, U. Vogt, "Understanding dose correction for high-resolution 50 kV electron-beam lithography on thick resist layers", Micro and Nano Engeneering 16, 100141 (2022).
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R. Akan, K. Parfeniukas, C. Vogt M. S. Toprak, and U. Vogt, "Reaction control of metal-assisted chemical etching for silicon-based zone plate nanostructures", RSC Advances 23, 12628-12634 (2018)
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F. Seiboth, A. Schropp, M. Scholz, F. Wittwer, C. Rödel, M. Wunsche, T. Ullsperger, S. Nolte, J. Rahomäki, K. Parfeniukas, U. Vogt, U. Wagner, C. Rau, U. Boesenberg, J. Garrevoet, G. Falkenberg, E. C. Galtier, H. J. Lee, B. Nagler, and C. G. Schroer, "Perfect X-ray focusing via fitting corrective glasses to aberrated optics", Nature Comm. 8, 14623 (2017).
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F. Uhlén, J. Rahomäki, D. Nilsson, F. Seiboth, C. Sanz, U. Wagner, C. Rau, and U. Vogt, "Ronchi test for characterization of X-ray nanofocusing optics and beamlines", J. Synch. Rad 21, 1105-1109 (2014).
People
